Panthera TEC MAT - Powerful Solutions for Material Sciences

The Panthera TEC offers high value for the inspection of semiconductors and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield, and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD models feature LD Plan BD objectives with a superb imaging performance, mounted on a 5-fold nosepiece.

The Panthera TEC series of industrial microscopes is the missing link in the Panthera family: incident light microscopes for material sciences, ready to handle semiconductors, LCD panels, and wafers with a clever Brightfield/Darkfield illumination concept. To extend the application fields for compound materials, microscope models with additional transmitted light by integrated LED illumination can be chosen.

• Smart Darkfield with 5 segment illumination mode
• New LD Plan Achromatic and S-Apochromatic BD objectives & 22mm FOV eyepieces
• Pure incident or incident/transmitted microscope stands available
• LED color temperature interchangeable
• Motic LightTracer: Coded nosepiece & digital light intensity knob